Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/17270
Title: RESOLUTION ENHANCEMENT IN RECURRENCE TRACKING MICROSCOPE
Authors: Khan, Hayat Ullah
Keywords: Electronics
Issue Date: 2018
Publisher: Quaid-i-Azam University, Islamabad
Abstract: Recurrence Tracking Microscope (RTM) works on quantum recurrence phenomena and probes nano-structures on a surface. RTM a scanning prob microscope, is based on ultra cold atoms / Bose Einstein Condensates bouncing off an atomic mirror. The change in initial height of nano particles due to variation in the cantilever position, changes revival times that measures structural changes on a surface. Present experimental technology can be applied to make the nano device, RTM, possible with bosonic atoms. The important advantage of condensed atoms over cold atoms is a small distribution width due to atomatom interactions. Thus, we expect a different and more precise measurement of quantum revival time which eventually modifies the resolution. For small nonlinear interatomic interaction there is a small change in quantum revival times , however, as interaction becomes stronger we find change in time of revival and resolution is enhanced using condensed atoms. Resolution can also be enhanced using frequency-time analysis
URI: http://hdl.handle.net/123456789/17270
Appears in Collections:Ph.D

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