
Please use this identifier to cite or link to this item:
http://hdl.handle.net/123456789/17270
Title: | RESOLUTION ENHANCEMENT IN RECURRENCE TRACKING MICROSCOPE |
Authors: | Khan, Hayat Ullah |
Keywords: | Electronics |
Issue Date: | 2018 |
Publisher: | Quaid-i-Azam University, Islamabad |
Abstract: | Recurrence Tracking Microscope (RTM) works on quantum recurrence phenomena and probes nano-structures on a surface. RTM a scanning prob microscope, is based on ultra cold atoms / Bose Einstein Condensates bouncing off an atomic mirror. The change in initial height of nano particles due to variation in the cantilever position, changes revival times that measures structural changes on a surface. Present experimental technology can be applied to make the nano device, RTM, possible with bosonic atoms. The important advantage of condensed atoms over cold atoms is a small distribution width due to atomatom interactions. Thus, we expect a different and more precise measurement of quantum revival time which eventually modifies the resolution. For small nonlinear interatomic interaction there is a small change in quantum revival times , however, as interaction becomes stronger we find change in time of revival and resolution is enhanced using condensed atoms. Resolution can also be enhanced using frequency-time analysis |
URI: | http://hdl.handle.net/123456789/17270 |
Appears in Collections: | Ph.D |
Files in This Item:
File | Description | Size | Format | |
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ELE 326.pdf | ELE 326 | 11.95 MB | Adobe PDF | View/Open |
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