Physical Properties of Vacuum Evaporated ZnTe Thin Films

Abstract

Zinc telluride (ZnTe) films have been prepared by the method of two sources vacuum evaporation. By evaporating Zn and Te powders, separately, using two quartz lamps as source heaters. The effects of different deposition parameters such as substrate temperature and evaporation rates of Zn and Te are studied. The optical properties of these films i.e. thickness, refractive index and energy gap have been calculated from the transmission spectra between 400-3200 nm recorded by UV-VIS-NIR spectrophotometer. DC electrical Resistivity measurement of samples, of area 1.0 cm2 show that, at room temperature, structures of different films have been studied by the method of X-ray diffraction using CU-KUI radiation and composition of the films measured by SEM attached with electron microprobe analyzer are also reported