Ferroelectric properties of P(VDF-TrFE) thin films heat treated at different temperatures

Abstract

Current research focuses on the ferroelectric attributes of the polyvinylidene fluoride Trifluoroethylene (P(VDF-TrFE)) thin films fabricated through spin coating technique. After spin coating films were annealed at 110°C,120°C,130°C,140°C and 150°C. The X-ray diffraction technique was used to confirm the existence of β-phase. The degree of crystallization in the specimens was subsequently shown to vary because of annealing temperature of films. The ferroelectric characteristics of specimens were thoroughly examined. Ferroelectric loops have been obtained by subjecting the specimens to sinusoidal voltage signal. P(VDF-TrFE) films exhibited well-defined hysteresis loops, revealing the presence of switching polarization. The positive up negative down (PUND) methodology was used to analyze switching as well as non switching behaviors. The true value of polarization has been extracted from the PUND measurement. The retrieved PUND loops enable us to investigate the responses of actual polarization that related to ferroelectric domain switching. A thorough comparison of apparent polarization and true polarization in samples of varying annealing temperature was performed, allowing for an in-depth understanding of the connection between them. The switching polarization and space charge polarization affects the observed value of remnant polarization at lower frequencies, leading to a greater overall value. The effect of the frequency of the applied signal is also examined on ferroelectric thin films specimens. Furthermore, the capacitor like geometry fabricated with different metal electrodes is analyzed to understand the interfacial effect.